28–30 Sept 2026
Kaiserslautern
Europe/Berlin timezone

A Portable Endstation for Nanobeam X-ray Spectromicroscopy in the Soft and Tender X-ray Range

29 Sept 2026, 18:40
20m
Foyer (Building 42)

Foyer

Building 42

Poster Biophysics Postersession II

Speaker

Mara Mußhoff (Hochschule Koblenz)

Description

The combination of scanning transmission X-ray microscopy (STXM) and X-ray fluorescence (XRF) analysis enables the simultaneous acquisition of elemental distribution maps and multiple transmission imaging modes. In the soft and tender X-ray range, this combination has become an increasingly powerful tool for materials science, biomedical, and environmental research.
We present the portable endstation AnImaX (Analytical Imaging with X-rays) for synchrotron-based analytical imaging and spectroscopy with nanometer-scale spatial resolution [1,2]. Originally developed for the P04 beamline at PETRA III (Hamburg), AnImaX is currently operated at the PGM beamline for undulator radiation of the Physikalisch-Technische Bundesanstalt at BESSY II (Berlin), demonstrating its portability and adaptability across synchrotron facilities. Simultaneous acquisition of transmission images and XRF maps is achieved using a 2D detector in transmission mode and a four-segment silicon drift detector with a large solid angle of detection (1.1 sr), enabling dwell times as short as 1 ms, depending on beamline capabilities and sample conditions. The current set of zone plate optics covers a photon energy range of 250–3000 eV.
AnImaX is currently used for studies in environmental science and nanoelectronics for the investigation of memristive devices [3]. In this contribution, we want to highlight recent experiments of the analysis of artificial nanostructures to demonstrate the instruments capabilities. In addition, we will present selected insights from studies of biomedical samples, demonstrating how optimized fluorescence excitation conditions can improve elemental sensitivity and support nanoscale chemical imaging of biologically relevant structures.
[1] L. Lühl et al, J. Synchrotron Radiation 26, 2019, 430-438.
[2] A. Haidl et al, Microscopy and Microanalysis 24(S2), 2018, 230-231.
[3] A. Wählisch et al, Advanced Electronic Materials, 2026, e00784.

Authors

Andreas Haidl (Hochschule Koblenz) Dr André Wählisch (Physikalisch-Technische Bundesanstalt) Prof. Birgit Kanngießer (Technische Universität Berlin) Dr Burkhard Beckhoff (Physikalisch-Technische Bundesanstalt) Dr Leona J. Bauer (Technische Universität Berlin) Mara Mußhoff (Hochschule Koblenz) Marc Dummin (Technische Universität Berlin) Prof. Thomas Wilhein (Hochschule Koblenz)

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